ROBUST, SMALL SCALE ELECTRICAL CONTACTOR

摘要

A contactor for use in testing integrated circuit chips. The contactor is made with an array of V-shaped contact elements. The V-shaped contact elements are nested so that the contact elements can be longer than the pitch of the contact points. In this way, the compliance of the beam portions of the contact elements can be increased. Also, the V-shape is very robust. Further, the V-shape allows "fly-by" testing, which is very useful at high speeds.