发明名称 MULTIBEAM SCAN APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To make a multibeam scan apparatus compact and stably scan deflected beams by the action of a deflecting disk diffracting and passing entering beams by setting at the multibeam scan apparatus the deflecting disk which can deflect and scan at least two beams simultaneously. SOLUTION: A multibeam scan apparatus has light sources 10a, 10b, 10c, 10d for generating and projecting light, a beam changer 20 for deflecting and scanning beams projected from each light source, and a beam correction means 30 for correcting deflected beams. The light sources 10a-10d are semiconductor lasers projecting laser light and can be driven selectively. The beam changer 20 is provided with a driving motor 21, and a deflecting disk 23 of a plurality of sectors 24a-24f set at a rotary shaft 21a of the driving motor 21 and scanning, deflecting entering beams. The sector has a pattern formed to diffract, pass the entering beams at the rotation of the deflecting disk 23 and deflect, scan the beams per scan line.</p>
申请公布号 JPH11198432(A) 申请公布日期 1999.07.27
申请号 JP19980154996 申请日期 1998.06.03
申请人 SAMSUNG ELECTRON CO LTD 发明人 EUM JAE-YONG;LEE WON-HYUNG;HAN CHEOL-YOUNG;CONNERS GARY H
分类号 B41J2/44;B41J2/385;G02B26/10;H04N1/191;H04N1/50;(IPC1-7):B41J2/44 主分类号 B41J2/44
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