发明名称 Method of fabricating a thin film transistor in which the channel region of the transistor consists of two portions of differing crystallinity
摘要 A semiconductor device which is excellent in reliability and electrical characteristics. The semiconductor device is formed on an insulating substrate. A channel region is formed between a source and a drain by the voltage applied to a gate electrode. The channel region, the source, and the drain are fabricated from a semiconductor having a large mobility. The other regions including the portion located under the channel region are fabricated from a semiconductor having a small mobility.
申请公布号 US5930608(A) 申请公布日期 1999.07.27
申请号 US19960682414 申请日期 1996.07.17
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI, SHUNPEI;TAKEMURA, YASUHIKO
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址