发明名称 |
Monocrystalline silicon wafer and method of thermally oxidizing a surface thereof |
摘要 |
A monocrystalline silicon wafer is improved so as not to cause enhanced oxidation at the time of forming a gate oxide film. The monocrystalline silicon wafer includes a monocrystalline silicon substrate. The monocrystalline silicon substrate has potassium concentration of at most 2x1011 atoms/cm2 at an outer surface thereof.
|
申请公布号 |
US5928786(A) |
申请公布日期 |
1999.07.27 |
申请号 |
US19960595145 |
申请日期 |
1996.02.01 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MUKOGAWA, YASUKAZU;KIMURA, YASUHIRO |
分类号 |
C23C8/10;H01L21/02;H01L21/28;H01L21/316;H01L21/76;H01L27/12;H01L29/78;(IPC1-7):B32B9/00 |
主分类号 |
C23C8/10 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|