发明名称 Monocrystalline silicon wafer and method of thermally oxidizing a surface thereof
摘要 A monocrystalline silicon wafer is improved so as not to cause enhanced oxidation at the time of forming a gate oxide film. The monocrystalline silicon wafer includes a monocrystalline silicon substrate. The monocrystalline silicon substrate has potassium concentration of at most 2x1011 atoms/cm2 at an outer surface thereof.
申请公布号 US5928786(A) 申请公布日期 1999.07.27
申请号 US19960595145 申请日期 1996.02.01
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MUKOGAWA, YASUKAZU;KIMURA, YASUHIRO
分类号 C23C8/10;H01L21/02;H01L21/28;H01L21/316;H01L21/76;H01L27/12;H01L29/78;(IPC1-7):B32B9/00 主分类号 C23C8/10
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