发明名称 Method and apparatus for testing counter and serial access memory
摘要 In a method for testing a counter, the counter is first set at a predetermined initial value. Then, the counter is incremented in response to the clocks. The number of the clocks is counted until a carry is outputted from the counter to provide an actual counted value. The actual counted value is compared to a reference value, which is calculated in advance. And then, the counter is decided whether to be operating normally or not on the basis of the result of the comparison.
申请公布号 US5930186(A) 申请公布日期 1999.07.27
申请号 US19970959443 申请日期 1997.10.28
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 IWAKIRI, ITSURO
分类号 G01R31/28;G01R31/00;G01R31/3185;G06F11/00;G11C29/00;G11C29/02;G11C29/22;H03K21/40;(IPC1-7):G11C7/00 主分类号 G01R31/28
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