Side scatter tomography system

摘要

An x-ray tomography system measures x-rays side-scattered by material concealed within an enveloping surface. One or more x-ray beams are incident on the enveloping surface and scattered onto collimated detectors disposed in arrays parallel to the incident x-ray beams. By varying the relative orientation of the enveloping surface with respect to the x-ray beams and measuring the x-rays side-scattered by the material concealed within the enveloping surface, the shape, density, position and composition of the contents of the enveloping surface may be mapped.