发明名称 |
Molten metal probe |
摘要 |
<p>A molten metal probe which is dipped into molten metal and thereafter pulled up therefrom and which is capable of preferably providing solidification temperature data of the molten metal and providing a solidified sample. A probe main body (1) includes an introductory path (8) facing a flow inlet (3) formed at a side portion thereof, a communicating path (9) and a sampling path (27) branched respectively upwardly and downwardly from the introductory path (8), a temperature measuring chamber (10) communicated with the communicating path (9) extended upwardly, a sampling chamber (25) communicated with the sampling path (27) extended downwardly, and a temperature sensor (22) facing the temperature measuring chamber (10). <IMAGE></p> |
申请公布号 |
EP0930494(A2) |
申请公布日期 |
1999.07.21 |
申请号 |
EP19990100092 |
申请日期 |
1999.01.05 |
申请人 |
KAWASO ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
IKAWA, OSAMU;IWAMOTO, YASUNORI |
分类号 |
G01N1/10;G01K13/12;G01N1/12;G01N33/20;(IPC1-7):G01N1/12 |
主分类号 |
G01N1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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