发明名称 Molten metal probe
摘要 <p>A molten metal probe which is dipped into molten metal and thereafter pulled up therefrom and which is capable of preferably providing solidification temperature data of the molten metal and providing a solidified sample. A probe main body (1) includes an introductory path (8) facing a flow inlet (3) formed at a side portion thereof, a communicating path (9) and a sampling path (27) branched respectively upwardly and downwardly from the introductory path (8), a temperature measuring chamber (10) communicated with the communicating path (9) extended upwardly, a sampling chamber (25) communicated with the sampling path (27) extended downwardly, and a temperature sensor (22) facing the temperature measuring chamber (10). &lt;IMAGE&gt;</p>
申请公布号 EP0930494(A2) 申请公布日期 1999.07.21
申请号 EP19990100092 申请日期 1999.01.05
申请人 KAWASO ELECTRIC INDUSTRIAL CO., LTD. 发明人 IKAWA, OSAMU;IWAMOTO, YASUNORI
分类号 G01N1/10;G01K13/12;G01N1/12;G01N33/20;(IPC1-7):G01N1/12 主分类号 G01N1/10
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