| 摘要 |
PROBLEM TO BE SOLVED: To shorten the test time of all multichannel electronic equipments in the same lot. SOLUTION: This testing device 10 is obtained by adding an attenuator 12 for simultaneously adjusting a level of a test signal TS of each channel from a signal source 11 at the same level, and a power sensor 16/a power meter 17 for simultaneously measuring the total power level of all the channels in a multichannel electronic equipment to a conventional testing device. When the test of the multichannel electronic equipment in the same lot is performed by measuring its electric feature when an output power of each channel is at a prescribed level by using the testing device 10, the first equipment in the same lot is subjected to the measurement and adjustment of an output power level for every channel and the measurement of the total power level of all the channels, and equipments on and after the second equipment are subjected to the measurement of the total power and adjustment to the same level as the total power level of the first equipment altogether. |
