发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of stably forming a contact hole. SOLUTION: A stopper film 9a is provided on a gate electrode 4, and an inter-layer insulation film 5 is provided on a semiconductor substrate 1 so as to cover the gate electrode 4. A first contact hole 6a for exposing the surface of the gate electrode 4 is passed through the inter-layer insulation film 5 and the stopper film 9a, and a second contact hole 6b for exposing the surface of an impurity diffused layer 3 is provided in the inter-layer insulation film 5. The stopper film 9a is formed by a material of etching selection ratio higher than that of the inter-layer insulation film 5.
申请公布号 JPH11195704(A) 申请公布日期 1999.07.21
申请号 JP19980000019 申请日期 1998.01.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 MAEDA ATSUSHI
分类号 H01L21/3205;H01L21/336;H01L21/768;H01L23/52;H01L23/522;H01L29/78;(IPC1-7):H01L21/768;H01L21/320 主分类号 H01L21/3205
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