发明名称 Semiconductor processing method of promoting photoresist adhesion to an outer substrate layer predominately comprising silicon nitride
摘要 A semiconductor processing method of promoting adhesion of photoresist to an outer substrate layer predominately comprising silicon nitride includes, a) providing a substrate; b) providing an outer layer of Si3N4 outwardly of the substrate, the outer Si3N4 layer having an outer surface; c) covering the outer Si3N4 surface with a discrete photoresist adhesion layer; and d) depositing a layer of photoresist over the outer Si3N4 surface having the intermediate discrete adhesion layer thereover, the photoresist adhering to the Si3N4 layer with a greater degree of adhesion than would otherwise occur if the intermediate discrete adhesion layer were not present. Further, a method in accordance with the invention includes, i) providing an outer layer of Si3N4 outwardly of the substrate, the outer Si3N4 layer having an outer surface; ii) transforming the outer Si3N4 surface into a material effective to promote adhesion of photoresist to the Si3N4 layer; and iii) depositing a layer of photoresist over the transformed outer Si3N4 surface, the photoresist adhering to the Si3N4 layer with a greater degree of adhesion than would otherwise occur if the outer Si3N4 surface were not transformed.
申请公布号 US5926739(A) 申请公布日期 1999.07.20
申请号 US19950567090 申请日期 1995.12.04
申请人 MICRON TECHNOLOGY, INC. 发明人 ROLFSON, J. BRETT;MARTIN, ANNETTE L.;NIROOMAND, ARDAVAN
分类号 H01L21/312;H01L21/314;H01L21/318;(IPC1-7):H01L21/318 主分类号 H01L21/312
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