发明名称 Floating gate type non-volatile semiconductor memory device having separate tunnel and channel regions controlled by a single gate structure
摘要 A tunnel region is surrounded by an impurity diffusion layer and a drain diffusion layer, and a coupling portion coupling one and the other end portions of a floating gate to each other is arranged on only an isolation region. With this arrangement, even if a parasitic inversion layer is formed below the other end portion upon extraction of electrons, the parasitic inversion layer does not contact a semiconductor substrate, resulting in a small substrate current. Therefore, a high-voltage, large-current external power supply need not be prepared in addition to a normal voltage power supply.
申请公布号 US5925906(A) 申请公布日期 1999.07.20
申请号 US19970961037 申请日期 1997.10.30
申请人 SONY CORPORATION 发明人 TANAKA, AKIRA
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/76 主分类号 H01L21/8247
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