发明名称 |
X-RAY SENSOR AND X-RAY INSPECTION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To improve the resolution of a sensor for performing an accurate inspection inexpensively. SOLUTION: In sensor structure for converting X rays to light by a phosphor 3 being formed on a substrate 1 and for taking out the converted light as an image signal by a photoelectric conversion part 2, the phosphor 3 is formed on the etched substrate 1 and the formation pattern of the phosphor 3 is generated by etching the substrate 1 itself, thus accurately forming the shape of the phosphor 3, achieving structure for reducing the diffusion of fluorescence, and providing a high-resolution sensor.
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申请公布号 |
JPH11190773(A) |
申请公布日期 |
1999.07.13 |
申请号 |
JP19970360305 |
申请日期 |
1997.12.26 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
SUZUKI NORIYUKI;TSUJIMURA SHOJI;ICHIHARA MASARU;OGURA HIROSHI;OKUMURA KAZUMASA |
分类号 |
G01N23/04;G01T1/00;G01T1/20;G21K4/00;(IPC1-7):G01T1/00 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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