发明名称 |
Sputtering apparatus for forming a conductive film in a contact hole of a high aspect ratio |
摘要 |
A sputtering apparatus contains a sputtering reaction chamber. A target is provided in the sputtering reaction chamber. A shielding plate is provided in the vicinity of the target. An emitter is electrically connected to the shielding plate for causing ionized sputter-particles and neutral sputter-particles to be emitted from the target and dropped at various angles into an under-space positioned under the target and in the sputtering reaction chamber. A substrate holder is provided in the sputtering reaction chamber. The substrate holder is laterally distanced from the under-space for holding a substrate so that a surface of the substrate is vertical. A generator is provided for generating a static field in a lateral direction to be applied across a laterally extending space which includes the substrate holder and the under-space so that the static field does laterally accelerate only the ionized sputter-particles toward the substrate held by the substrate holder for a lateral deposition of the ionized sputter-particles onto the surface of the substrate.
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申请公布号 |
US5922180(A) |
申请公布日期 |
1999.07.13 |
申请号 |
US19960759777 |
申请日期 |
1996.12.03 |
申请人 |
NEC CORPORATION |
发明人 |
HOSHINO, AKIRA |
分类号 |
C23C14/04;C23C14/16;C23C14/34;C23C14/35;H01J37/34;H01L21/203;H01L21/285;(IPC1-7):C23C14/34;C23C14/42;C23C14/44 |
主分类号 |
C23C14/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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