发明名称 Sputtering apparatus for forming a conductive film in a contact hole of a high aspect ratio
摘要 A sputtering apparatus contains a sputtering reaction chamber. A target is provided in the sputtering reaction chamber. A shielding plate is provided in the vicinity of the target. An emitter is electrically connected to the shielding plate for causing ionized sputter-particles and neutral sputter-particles to be emitted from the target and dropped at various angles into an under-space positioned under the target and in the sputtering reaction chamber. A substrate holder is provided in the sputtering reaction chamber. The substrate holder is laterally distanced from the under-space for holding a substrate so that a surface of the substrate is vertical. A generator is provided for generating a static field in a lateral direction to be applied across a laterally extending space which includes the substrate holder and the under-space so that the static field does laterally accelerate only the ionized sputter-particles toward the substrate held by the substrate holder for a lateral deposition of the ionized sputter-particles onto the surface of the substrate.
申请公布号 US5922180(A) 申请公布日期 1999.07.13
申请号 US19960759777 申请日期 1996.12.03
申请人 NEC CORPORATION 发明人 HOSHINO, AKIRA
分类号 C23C14/04;C23C14/16;C23C14/34;C23C14/35;H01J37/34;H01L21/203;H01L21/285;(IPC1-7):C23C14/34;C23C14/42;C23C14/44 主分类号 C23C14/04
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