发明名称 |
Method of making greek letter psi shaped capacitor for DRAM circuits |
摘要 |
A method of forming a capacitor having a cross section shape similar to the Greek letter psi. The shape of the capacitor plate provides a high capacitance using a modest amount of chip area. A capacitor hole is etched in a thick layer of a first dielectric. A layer of polysilicon is formed on the dielectric layer covering the sidewalls and bottom of the capacitor hole. A second dielectric is then used to fill the hole. A contact hole in the second dielectric extends to the contact region of the wafer and is filled with a polysilicon plug. The polysilicon plug and the polysilicon covering the sidewalls and bottom of the capacitor hole form the first capacitor plate. A layer of hemispherical grain polysilicon can be used to further increase the surface area of the first capacitor plate.
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申请公布号 |
US5923973(A) |
申请公布日期 |
1999.07.13 |
申请号 |
US19970957674 |
申请日期 |
1997.10.24 |
申请人 |
VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
CHEN, LI YEAT;LIAW, ING-RUEY |
分类号 |
H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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