发明名称 Method of making greek letter psi shaped capacitor for DRAM circuits
摘要 A method of forming a capacitor having a cross section shape similar to the Greek letter psi. The shape of the capacitor plate provides a high capacitance using a modest amount of chip area. A capacitor hole is etched in a thick layer of a first dielectric. A layer of polysilicon is formed on the dielectric layer covering the sidewalls and bottom of the capacitor hole. A second dielectric is then used to fill the hole. A contact hole in the second dielectric extends to the contact region of the wafer and is filled with a polysilicon plug. The polysilicon plug and the polysilicon covering the sidewalls and bottom of the capacitor hole form the first capacitor plate. A layer of hemispherical grain polysilicon can be used to further increase the surface area of the first capacitor plate.
申请公布号 US5923973(A) 申请公布日期 1999.07.13
申请号 US19970957674 申请日期 1997.10.24
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 CHEN, LI YEAT;LIAW, ING-RUEY
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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