发明名称 MOS field effect transistor and its manufacturing method
摘要 A method of manufacturing a MOS field effect transistor comprises forming on a semiconductor substrate a first epitaxial growth layer having an impurity doping concentration lower than that of the semiconductor substrate, forming on the first epitaxial growth layer a second epitaxial growth layer having an impurity concentration higher than that of the first epitaxial growth layer and having a thickness equal to or less than a diffusion depth of a source and a drain region, and forming on the second eptiaxial growth layer a third epitaxial growth layer having an impurity concentration lower than that of the second epitaxial growth layer and having a thickness equal to or less than that of a depletion layer at a channel region.
申请公布号 US5923985(A) 申请公布日期 1999.07.13
申请号 US19970782975 申请日期 1997.01.14
申请人 SEIKO INSTRUMENTS INC. 发明人 AOKI, KENJI;TAKADA, RYOJI
分类号 H01L21/336;H01L29/10;H01L29/78;(IPC1-7):H01L21/336;H01L21/20 主分类号 H01L21/336
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