发明名称 Magnetoresistance device
摘要 PCT No. PCT/JP96/02702 Sec. 371 Date Apr. 18, 1997 Sec. 102(e) Date Apr. 18, 1997 PCT Filed Sep. 19, 1996 PCT Pub. No. WO97/11499 PCT Pub. Date Mar. 27, 1997According to the present invention on a magnetoresistance device having a magnetoresistance effect element, since iron oxide FeOx exhibiting antiferromagnetism is used as a pinning layer, a spin-valve type magnetoresistance effect element can be obtained which is particularly excellent in corrosion resistance and has a magnetoresistance ratio with an MR slope no less than 0.7% Oe in the region of the high-frequency magnetic field of 1 MHz. Further, the rise-up characteristic of an MR curve at the zero magnetic field is extremely excellent with small hysteresis, and it has high heat resistance. The heat resistance is further improved by interposing an oxygen blocking layer between the pinning layer and a ferromagnetic layer. In the magnetoresistance device, for example, an MR head, using the magnetoresistance effect element having a magnetic multilayer film, an output voltage is approximately five times as high as that of the conventional material. Accordingly, there can be provided an excellent MR head which has extremely high reliability and enables the reading for ultrahigh density magnetic recording exceeding 1 Gbit/inch2.
申请公布号 US5923504(A) 申请公布日期 1999.07.13
申请号 US19970817098 申请日期 1997.04.18
申请人 TDK CORPORATION 发明人 ARAKI, SATORU;SATO, YUICHI;SHINOURA, OSAMU
分类号 G11B5/39;H01F10/32;H01L43/08;H01L43/10;(IPC1-7):G11B5/127 主分类号 G11B5/39
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