发明名称 DRY ETCHING
摘要 PROBLEM TO BE SOLVED: To provide a method for easily dry etching an inverted mesa structure. SOLUTION: Ions (containing radicals) 17 are made to fall on the surface of a semiconductor wafer 10 at an angle of incidenceθ. Then, this wafer 10 is revolved around the central axis 16 of a cavity formed in the wafer 10. Whereupon, dry-etched surface 15 which has an inverted mesa type notch can be formed on the surface of the wafer 10.
申请公布号 JPH11186219(A) 申请公布日期 1999.07.09
申请号 JP19970347599 申请日期 1997.12.17
申请人 OKI ELECTRIC IND CO LTD 发明人 KOBAYASHI MASAO
分类号 H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
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