发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device having a CSP structure whose productivity is made high, whose quality is made stable, and whose reliability is made high, and a method for manufacturing this device. SOLUTION: An IC integrated circuit 1 is fixed to a circuit board 2 by using a die bond material 3, an electrode 4 on the IC integrated circuit 1 is electrically connected through a metallic wire 7 with a first electrode 5 on the circuit board 2, and first and second solder bumps 8a and 8b are provided as the outside terminal of a resin sealed semiconductor package in a semiconductor device in a CSP structure. At the time of transfer molding using a die, the first solder bump 8a is resin-sealed so as to be brought into contact with a die 12 for sealing so that the first solder bump 8a can be exposed on the surface of sealing resin 9. Then, the second solder bump 8b is joined to the exposed first solder part 8a so that the outside terminal of a semiconductor package can be formed.</p>
申请公布号 JPH11186449(A) 申请公布日期 1999.07.09
申请号 JP19970356800 申请日期 1997.12.25
申请人 MITSUBISHI ELECTRIC CORP 发明人 MISUMI KAZUYUKI;MORI RYUICHIRO
分类号 H01L21/60;H01L21/50;H01L21/52;H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L21/60
代理机构 代理人
主权项
地址
您可能感兴趣的专利