发明名称 SEMICONDUCTOR SUBSTRATE POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent the decreasing of a polishing speed, in the case of fall out of diamond in a conditioner surface, avoid the generation of a scratch in a wafer surface by fall out chips. SOLUTION: This device has a polishing pad 1 stuck to a rotary table 2, wafer 3 opposing a surface to the polishing pad 1 to be held to a wafer carrier 4, and a conditioner 6 brought into pressure contact with the polishing pad 1 to swivel thereon to be driven to rotate. The rotary table 2 and the wafer carrier 4 are respectively driven, the wafer 3 is brought into pressure contact with the polishing pad 1, between the polishing pad and the wafer, slurry from a slurry supply port 5 flows in, a wafer surface is polished. In a periphery of the conditioner 6, a suction part 7 having a suction hole is mounted, polishing chips and pad chips by polishing pad conditioning are immediately recovered from the suction part.
申请公布号 JPH11179648(A) 申请公布日期 1999.07.06
申请号 JP19970364972 申请日期 1997.12.19
申请人 NEC CORP 发明人 KURISAWA OSAMU
分类号 B24B53/017;H01L21/304 主分类号 B24B53/017
代理机构 代理人
主权项
地址