发明名称 Memory device using block write mode, simultaneous column writes with column address selection circuit and segment start/stop address latches
摘要 A column address selection circuit 1 is provided, which renders all column address signals (CSi), from a start address to a stop address designated by a column address signal (ADCd+ADCu), to be a selective level when a segment address selection signal (SASj) and a block write signal (BW) are at an active level. A segment address selection circuit 2 is provided, which renders all segment address selection signals (SASj), from the start address to the stop address designated by the column address signal (ADCu) of a superordinate side, to be a selection level to supply it to the column address selection circuit 1, when the block write signal (BW) is at the active level.
申请公布号 US5920883(A) 申请公布日期 1999.07.06
申请号 US19960756518 申请日期 1996.11.26
申请人 NEC CORPORATION 发明人 TAMAKI, SATOSHI;FUJIO, MOEMI
分类号 G11C11/401;G11C8/10;G11C8/12;G11C11/407;(IPC1-7):G06F12/00 主分类号 G11C11/401
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