SEMICONDUCTOR-TESTING DEVICE,申请号JP19970344730-传众专利搜索

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发明名称	SEMICONDUCTOR-TESTING DEVICE
摘要
申请公布号	JPH11174131(A)	申请公布日期	1999.07.02
申请号	JP19970344730	申请日期	1997.12.15
申请人	ADVANTEST CORP	发明人	TAKAHASHI KOJI
分类号	G01R31/28;G01R31/3183;G01R31/319;(IPC1-7):G01R31/318	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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