发明名称 LATENT IMAGE DETECTING METHOD AND EXPOSURE CONDITION DETECTING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for surely detecting a latent image and the exposure condition even if the change in shape of an exposed photosensitive material is small in a method of directly detecting the latent image and the exposure condition without development and baking process. SOLUTION: During Y-direction scanning, frictional force is produced between a probe 51 coming into contact with the surface of a specimen 1 and the surface of the specimen 1 to cause torsion of a cantilever 5. Whereupon, the reflecting direction of laser light is changed. A four-split photo detector 9 detects such a change and outputs the detection as a cantilever displacement signal to a controller 14. The controller 14 processes a control signal output to a tube scanner driver 10 and a cantilever displacement signal to display the frictional force distribution on the surface of the specimen 1 as image data on a display means 15. In a latent image position, the frictional force is changed so that the latent image position can be measured by measuring the frictional force distribution.
申请公布号 JPH11174065(A) 申请公布日期 1999.07.02
申请号 JP19970356378 申请日期 1997.12.10
申请人 NIKON CORP 发明人 NAKAGIRI NOBUYUKI;SUGIZAKI KATSUMI
分类号 G01N37/00;G01Q60/24;G01Q60/26;G01Q60/32;G03F7/26;H01L21/027;(IPC1-7):G01N37/00 主分类号 G01N37/00
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