发明名称 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND MANUFACTURE OF RELIEF PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a positive photosensitive resin composition extremely high in sensitivity to active light such as i-line and capable of forming a satisfactory pattern by using an alkaline water solution, and a manufacturing method enabling a satisfactory relief pattern to be formed by exposure of active light such as i-line and by development using the alkaline developer. SOLUTION: In a positive photosensitive resin composition including (A) a polyimide precursor having a carboxyl radical or a phenolic hydroxyl radical, and (B) a compound producing an acid by light, the (A) constituent is a mixture of two kinds of polyimide precursors a ratio of whose dissolving speeds is 5 or more in an alkaline water solution, and, in a manufacturing method for a relief pattern, this positive photosensitive resin composition is spread over a substrate, dried, thereafter irradiated with active light, developed by the alkaline water solution, and heated.
申请公布号 JPH11174679(A) 申请公布日期 1999.07.02
申请号 JP19970339817 申请日期 1997.12.10
申请人 HITACHI CHEM CO LTD 发明人 SASAKI MAMORU;NUNOMURA MASATAKA;OE TADAYUKI;ANZAI TAKANORI;UCHIMURA SHUNICHIRO
分类号 G03F7/027;G03F1/68;G03F1/80;G03F7/028;G03F7/039;H01L21/027 主分类号 G03F7/027
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