发明名称 DEFORMATION STATE ANALYZER FOR STRUCTURE OR THE LIKE AND DATA RECORDER AND DATA ANALYZER USED FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To extremely simplify the work on a spot and to make even an inexperienced operator able to sample basic data for accurately analyzing the deformation state of a structure in a short time. SOLUTION: A reference marker M0 and a marker M1 for measurement are stuck to both sides of a position where a crack C to be the measurement point of an investigation object W such as the structure or the like is formed, the images of them are picked up by the data recorder 3, the image data are analyzed by the data analyzer 4 and thus, the X-Y-Z coordinate of the measurement point P1 formed at the marker M1 of the measurement is calculated. As the work on the spot, after the reference marker M0 and the marker M1 for the measurement are stuck to the respective measurement points, just the images of the respective markers M0 and M1 are picked up and it is extremely simple and is completed in a short time. Then, by fetching the image data every one to several months and comparing the coordinate of the same measurement point P1 , the displacement amount and a displacement direction are recognized.
申请公布号 JPH11173839(A) 申请公布日期 1999.07.02
申请号 JP19970346125 申请日期 1997.12.16
申请人 MORITEX CORP;CHITYUU SALVAGE KK;NIPPON SAMIKON KK 发明人 SANO HIROSHI;YOSHIDA AKIRA;OSAWA HIROSHI
分类号 G01B21/32;G06F17/00;G06F19/00;G06Q50/00;G06Q50/08;G06T1/00;G06T7/00 主分类号 G01B21/32
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