发明名称 MEASURING APPARATUS AND PROCESSING METHOD IN THE MEASURING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide a measuring apparatus by which the background can be corrected with good accuracy. SOLUTION: The measuring apparatus is provided with a spectroscope body 10 in which a sample cell is irradiated with light and which receives transmitted light which is transmitted through a sample inside the sample cell and a signal processor which performs a signal processing operation to a received signal and which measures the characteristic of the sample. The signal processor is provided with a first memory 12 which stores the received signal, a reflection- loss correction part 12 which reads out a transmission spectrum stored in the first memory 12 and which corrects an error caused by a reflection loss generated in the sample cell, a second memory 14 which stores correction data generated by the reflection-loss correction part 13, a scattered-light correction part 15 which reads out the correction data stored in the second memory 14 and which corrects an error caused by scattered light generated when the sample is irradiated and an output part 17 which outputs data in which the influence of a background generated by the scattered-light correction part 15 is corrected.</p>
申请公布号 JPH11173986(A) 申请公布日期 1999.07.02
申请号 JP19970362315 申请日期 1997.12.12
申请人 JASCO CORP 发明人 IWATA TETSUO;KOSHOBU JUN;OOKUBO MASAHARU
分类号 G01N33/44;G01N21/35;G01N21/359;G01N21/59 主分类号 G01N33/44
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