Dekompressionsschaltkreis

摘要

Described is a circuit 200 for applying a testing data to a DUT 30 for testing the DUT 30, comprising a buffer memory 210 for receiving and buffering a redundancy-free information as information which is substantially free of redundancy but might also comprise some redundant information to a certain extent, a redundancy memory 230 for storing a redundancy information as information comprising a certain amount of redundancy, and a processing unit 220 for generating the testing data by processing the redundancy-free information in association with the redundancy information. Further described is a method for applying a testing data to the DUT 30 for testing the DUT 30, comprising the steps of receiving and buffering the redundancy-free information, fetching in accordance with the received redundancy-free information the redundancy information, and generating the testing data by processing the redundancy-free information in association with the redundancy information.