发明名称 |
Dustproof fabric for a semiconductor cleanroom |
摘要 |
<p>A dustproof fabric for a semiconductor cleanroom is provided which achieves a high dustproof performance and high wearing-comfort. The dustproof fabric comprises : an inner layer 103 formed of a knitted fabric; an intermediate layer 102 attached on the inner layer and formed of a high moisture-absorbency polyurethane resin film of nonmicroporous type, and an outer layer 101 attached on the intermediate layer and formed of a high density polyester woven fabric containing warps and wefts of conductive yarn aligned and spaced a little apart from each other.</p> |
申请公布号 |
GB2332643(A) |
申请公布日期 |
1999.06.30 |
申请号 |
GB19980014346 |
申请日期 |
1998.07.03 |
申请人 |
* SAMSUNG ELECTRONICS CO LIMITED |
发明人 |
CHANG-SU * LIM;HYEOG-KI * KIM;SUE-RYEON * KIM;IL-KYOUNG * KIM |
分类号 |
A41D13/00;A41D31/02;B32B5/02;B32B5/26;B32B27/12;D03D1/00;D03D15/00;D04B21/00;D06N7/00;(IPC1-7):A41D31/02;D06N3/14 |
主分类号 |
A41D13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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