发明名称 Dustproof fabric for a semiconductor cleanroom
摘要 <p>A dustproof fabric for a semiconductor cleanroom is provided which achieves a high dustproof performance and high wearing-comfort. The dustproof fabric comprises : an inner layer 103 formed of a knitted fabric; an intermediate layer 102 attached on the inner layer and formed of a high moisture-absorbency polyurethane resin film of nonmicroporous type, and an outer layer 101 attached on the intermediate layer and formed of a high density polyester woven fabric containing warps and wefts of conductive yarn aligned and spaced a little apart from each other.</p>
申请公布号 GB2332643(A) 申请公布日期 1999.06.30
申请号 GB19980014346 申请日期 1998.07.03
申请人 * SAMSUNG ELECTRONICS CO LIMITED 发明人 CHANG-SU * LIM;HYEOG-KI * KIM;SUE-RYEON * KIM;IL-KYOUNG * KIM
分类号 A41D13/00;A41D31/02;B32B5/02;B32B5/26;B32B27/12;D03D1/00;D03D15/00;D04B21/00;D06N7/00;(IPC1-7):A41D31/02;D06N3/14 主分类号 A41D13/00
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