发明名称 Method and apparatus for repairing opens on global column lines
摘要 A memory array arranged in rows and columns includes a global column line. The global column line has proximal and distal ends and is adapted to enable a predetermined number of columns in the array. A repair circuit connected to the distal end of the global column line is adapted to detect a fault on the global column line and disable the global column line if the fault is detected. A repair circuit for a signal line includes a programming circuit and a sensing circuit. The programming circuit includes a programmable element and is adapted to detect a fault on the signal line and program the programmable element if the fault is detected. The sensing circuit is adapted to detect a programmed condition of the programmable element and ground an end of the signal line in response to the programmed condition. A method for repairing a memory array having a global column line includes detecting a fault on the global column line of the array and disabling the global column line if the fault is detected.
申请公布号 US5917763(A) 申请公布日期 1999.06.29
申请号 US19970928706 申请日期 1997.09.12
申请人 MICRON TECHNOLOGY, INC. 发明人 MULLARKY, PATRICK J.
分类号 G11C29/00;(IPC1-7):G11C7/00 主分类号 G11C29/00
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