| 发明名称 |
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| 摘要 |
<p>PURPOSE: To provide a method for inspecting a liquid crystal panel capable of inspecting the fault of the liquid crystal panel failing to be completely removed of a short circuit wiring. CONSTITUTION: The display signal to be supplied to signal lines, the counter signal to be supplied to a counter electrode and the ON power-supply voltage and OFF power-supply voltage of scanning signals are kept constant for the liquid crystal panel from which the short circuit wiring is completely removed. The two scanning lines are shorted by the short circuit wiring. The ON power source current 1g(H)0 of the time the luminance changeΔTO of the threshold for the normal/defective condition of the wire condition is induced in the liquid crystal panel by lowering the ON power source current of the scanning signal is measured. The OFF power source current 1g(L)0 of the time the luminance changeΔTO is induced by lowering the OFF power source current of the scanning signal is measured. The liquid crystal panel is cracked by using the ON power source current 1g(H)O and OFF power source current 1g(L)0 obtd. by the measurement as reference and the respective liquid crystal panels subjected the chamfering are inspected.</p> |
| 申请公布号 |
JP2912189(B2) |
申请公布日期 |
1999.06.28 |
| 申请号 |
JP19950125211 |
申请日期 |
1995.05.24 |
| 申请人 |
MATSUSHITA DENKI SANGYO KK |
发明人 |
KOSHIMIZU TOORU;OGAWA TETSU |
| 分类号 |
G02F1/13;G02F1/136;G02F1/1368;H01L29/786;(IPC1-7):G02F1/136 |
主分类号 |
G02F1/13 |
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