发明名称 Chemical mechanical polishing of tungsten@ via plugs
摘要 Chemical mechanical polishing, of a semiconductor wafer with a tungsten layer (38) on a dielectric layer (32), uses a single polishing pad (44) and a first slurry mixture (42) containing an oxidising agent to polish the tungsten and expose the dielectric layer. A second slurry mixture containing an oxide etchant is then used to polish the dielectric. Both slurry mixtures have a pH of 2-4. The first slurry includes water, Fe(NO3)3, Al2O3, H2O2, and may also contain KIO3.
申请公布号 FR2772986(A1) 申请公布日期 1999.06.25
申请号 FR19970016332 申请日期 1997.12.23
申请人 UNITED MICROELECTRONICS CORPORATION 发明人 YANG MING SHENG;WU JUAN YUAN;LUR WATER;SUN SHIH WEI
分类号 H01L21/304;C09K3/14;H01L21/321;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/304
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