发明名称 |
ION IMPLANTER, AND ITS METHOD |
摘要 |
An ion implanter and its method which enable a wafer to be heated uniformly to high temperature at all times regardless of scan operation even if a rotary disc retaining the wafer performs scan operation. Even if a rotary disc (7) performs mechanical scanning, a heater (12) moves synchronously with it, therefore uniform heating to high temperature becomes possible, by installing a heater housing (11) for wafer heating in a scan box (9) to perform the mechanical scanning, and further, installing a heater (12) in the position opposite to the wafer (5).
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申请公布号 |
WO9931705(A1) |
申请公布日期 |
1999.06.24 |
申请号 |
WO1997JP04587 |
申请日期 |
1997.12.12 |
申请人 |
HITACHI, LTD.;MERA, KAZUO;TOMITA, HIROYUKI |
发明人 |
MERA, KAZUO;TOMITA, HIROYUKI |
分类号 |
H01J37/317;(IPC1-7):H01J37/317;H01J37/20;H01L21/265 |
主分类号 |
H01J37/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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