发明名称 IC capacitor having tantalum nitride barrier layer containing a transition metal and/or a lanthanide
摘要 A capacitor in an integrated semiconductor circuit, comprising a first electrode (6) which is electrically connected to a doped area by means of a connecting structure (7), a second electrode (11), a capacitor dielectric (10) which is arranged between both electrodes and a barrier layer (9). The barrier layer (9) is mainly comprised of Ta-Me-N, whereby Me is an element or combination of several elements from the group of transition metals and/or lanthanides.
申请公布号 DE19811068(C1) 申请公布日期 1999.06.24
申请号 DE19981011068 申请日期 1998.03.13
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 BRUCHHAUS, RAINER, DR., 80997 MUENCHEN, DE;NAGEL, NICOLAS, 81539 MUENCHEN, DE;PRIMIG, ROBERT, 81541 MUENCHEN, DE;SCHINDLER, GUENTHER, DR., 80802 MUENCHEN, DE
分类号 H01L21/02;H01L21/8242;H01L27/06;(IPC1-7):H01L27/108;H01L27/08;H01L21/824 主分类号 H01L21/02
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