发明名称 Detector assembly for a scanning electron microscope
摘要 <p>Electron detector configuration for an environmental scanning electron microscope (ESEM), for detecting electrons emanating from the surface of the specimen. The detecting means comprise a printed circuit board (132) including a detector head (134) having thereon an electrically biased ring detector electrode (136), the ring electrode being disposed between the specimen (24) and a pressure limiting aperture (144) that is positioned at the interface of the vacuum column (10) and the specimen chamber (22). The pressure limiting aperture is preferably provided with means for electrically biassing it such that it can act as an electrically biased pressure limiting aperture detector, and it is preferably formed integrally on the printed circuit board (132). &lt;IMAGE&gt;</p>
申请公布号 EP0924743(A1) 申请公布日期 1999.06.23
申请号 EP19990200725 申请日期 1994.07.25
申请人 PHILIPS ELECTRONICS NORTH AMERICA CORPORATION 发明人 KNOWLES, RALPH W.;SCHULTZ, WILLIAM G.;ARMSTRONG, ALLEN E.
分类号 H01J37/256;H01J37/18;H01J37/22;H01J37/244;H01J37/28;(IPC1-7):H01J37/256 主分类号 H01J37/256
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