| 摘要 |
<p>An eddy current probe (62) for use in inspecting an object, includes a driver (70) having a coil (82) with an effective coil axis (124), and further includes a receiver (72) having a coil (92) with a coil axis (126) oriented substantially perpendicular to the driver coil effective coil axis, the receiver having a length (134), and a width (130), the length being the dimension in the direction parallel to the scanning path (116), and the width having a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a driver (70) having a coil (82) with an effective coil axis (124), the driver having a length (132) and a width (128), the length being the dimension in a direction substantially parallel to a scanning path (116), and further includes a receiver (72) having a coil (92) with a coil axis (126) oriented substantially perpendicular to the driver coil effective coil axis, where the magnitude of a distance between the receiver and at least one of the driver edges (140,144) is less than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe. <IMAGE></p> |
