发明名称 |
SEMICONDUCTOR MANUFACTURE DEVICE AND PROCESSING METHOD FOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor manufacture device which is capable of baking a wafer uniformly. SOLUTION: A hot plate unit 1 is provided with a cover 2. The cover is provided with an inner wall face 2c and a vacuum port 6. A plate 4 having an open pore 4a is provided immediately below the vacuum port 6. An interval between the plate 4 and a main face 7a is equal to an interval between the main face 7a and the inner wall face 2c. Furthermore, the hot plate unit 1 has evacuating amount adjustment valves 5a and 5b for suppressing the evacuation amount to 0.1 (liter/minute) or more and 1 (liter/minute) or lower. |
申请公布号 |
JPH11168045(A) |
申请公布日期 |
1999.06.22 |
申请号 |
JP19970332584 |
申请日期 |
1997.12.03 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
MIYAGI SATOSHI;YAMADA YOSHIAKI;SAITO TAKAYUKI |
分类号 |
G03F7/38;B05C9/14;G03F7/40;H01L21/00;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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