发明名称 Method for removing spin-on-glass at wafer edge
摘要 The present invention provides a method for removing unwanted coating layer at wafer edge by first immersing the wafer edge in a cleaning solution and then immersing in a rinsing solution such as deionized water to remove the residual cleaning solution from the surface of the wafer. The wafer can be dried in a subsequent spin dry process.
申请公布号 US5913979(A) 申请公布日期 1999.06.22
申请号 US19970780399 申请日期 1997.01.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 SHEN, CHIH-HENG;LIN, HUI-TZU
分类号 B08B3/08;H01L21/00;(IPC1-7):B08B3/08 主分类号 B08B3/08
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