| 摘要 |
PROBLEM TO BE SOLVED: To improve an S/N ratio of a microchip electrophoretic apparatus. SOLUTION: A detecting element number f(tn , ekx ) to be detected at a peak of a component (x) detected for an arbitrary time tk at an integration ending time tn is represented by f(tn , ekx )=(ekx -eka )(enb -ena )/(ekb -eka )+ea . And, data y(tk , e) measured at the time tk can be element-axis-converted into the integration ending time tn by y(tk , e)+y(tk , f(tn , ekx ). Respective peaks of the component (x) indicated in (A) are element-axis-converted into a position of a detecting element number (e) as shown in (B). An S/N ratio can be improved as shown in (C) by obtaining integration data by the number enx by using y(e)=1/(n+1)Σy(tk , f(tn , ekx )). |
