发明名称 X-RAY EXAMINATION APPARATUS
摘要 An X-ray examination apparatus includes an X-ray detector for deriving an image signal from an X-ray image. The X-ray detector has an essentially elongate X-ray-sensitive surface. The X-ray sensitive surface of the X-ray detector corresponds notably to a relevant part of the object to be examined.
申请公布号 WO9930485(A2) 申请公布日期 1999.06.17
申请号 WO1998IB01896 申请日期 1998.11.30
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS AB 发明人 LINDERS, PETRUS, W., J.;MEULENBRUGGE, HENDRIK, J.
分类号 G01T1/164;A61B6/00;G01T1/20;H04N3/15;H04N5/32 主分类号 G01T1/164
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