发明名称 WAFER SORTING DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent the damage of a wafer during the sorting process by reading the position and attitude of the wafer extracted by the hand of a wafer conveying robot with a reading means at a first reading position, reading the written characters of the wafer with a reading means at a second reading position, and controlling the wafer conveying robot. SOLUTION: A wafer conveying robot 2 positions a wafer 1 in a feed cassette 3 at a first reading position below a first camera 9a. The correction data in the X, Y,θdirections based on the position coordinated of the wafer 1 are outputted to the wafer conveying robot 2 via the first camera 9a, a first image processing device 12a, a coordinated converting device 14 and a position correcting device 15. The wafer conveying robot 2 conveys and positions the wafer 1 so that the character description position of the wafer 1 enters the visual field of a second camera 9b at a second reading position. The wafer 1 is sorted by the second camera 9b, a second image processing device 12b and a sort data reference device 16, and the sorted signal is sent to the wafer conveying robot 2, and the wafer 1 is inserted into the prescribed sort cassette.
申请公布号 JPH11157609(A) 申请公布日期 1999.06.15
申请号 JP19970328033 申请日期 1997.11.28
申请人 KOMATSU ENGINEERING KK 发明人 NISHI YOZO;KOKUSHI YOSHIAKI
分类号 B65G1/00;B25J13/08;G06K9/20;H01L21/677;H01L21/68;(IPC1-7):B65G1/00 主分类号 B65G1/00
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