发明名称 SEMICONDUCTOR WAFER PRODUCING METHOD
摘要 <p>A system for producing a semiconductor wafer includes a production progress comparing/calculating unit, a fabrication device status monitor step, an inventory control step, and a process shelf controller step. In response to a timing signal from the fabrication device status monitor step, the production progress comparing/calculating unit determines a semiconductor wafer to be processed next, and the determined semiconductor wafer is automatically searched for on a process shelf. The fabrication devices of a semiconductor wafer production line start processing semiconductor wafers at suitable times thereby producing semiconductor wafers according to a production plan and meeting a delivery time for the semiconductor wafers.</p>
申请公布号 KR100201794(B1) 申请公布日期 1999.06.15
申请号 KR19950061271 申请日期 1995.12.28
申请人 NEC CORPORATION 发明人 TOKASHI, YOICHI
分类号 G05B19/418;H01L21/00;H01L21/66;(IPC1-7):H01L21/00 主分类号 G05B19/418
代理机构 代理人
主权项
地址
您可能感兴趣的专利