发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A method of fabricating a semiconductor device includes the steps of forming a plurality of gate electrodes on a first region and a second region of a substrate, the plurality of gate electrodes having cap insulating layers thereon; forming source and drain regions in the first region and the second region, the source and drain regions of the second region having an LDD structure; forming an insulating layer on the substrate including the plurality of gate electrodes; forming contact holes in the insulating layer to simultaneously expose the source and the drain regions of the first region and the cap insulating layer on the gate electrodes in the second region; selectively removing the cap insulating layer on the gate electrodes in the second region; and forming a metal line in the contact holes and on the insulating layer.
申请公布号 KR100192521(B1) 申请公布日期 1999.06.15
申请号 KR19960029219 申请日期 1996.07.19
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 LIM, JOON-HI
分类号 H01L21/302;H01L21/28;H01L21/3065;H01L21/768;H01L21/8234;H01L21/8239;H01L21/8242;H01L23/522;H01L27/088;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/302
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