发明名称 Methods for forming contact holes having improved sidewall profiles
摘要 A method for forming a contact hole in a phosphosilicate glass layer includes the steps of forming a phosphosilicate glass layer, reflowing the phosphosilicate glass layer, removing a surface portion of the phosphosilicate glass layer, and forming the contact hole in the phosphosilicate glass layer. In particular, the surface portion of the phosphosilicate glass layer can be on the order of about 1000 ANGSTROM thick, and the step of removing the surface portion can include etching the surface portion. Furthermore, the step of forming the contact hole can include the step of selectively wet etching the phosphosilicate glass layer followed by the step of selectively dry etching the phosphosilicate glass layer.
申请公布号 US5912185(A) 申请公布日期 1999.06.15
申请号 US19960772431 申请日期 1996.12.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, HYUK-KYUNG
分类号 H01L21/28;H01L21/311;H01L21/768;(IPC1-7):H01L21/302 主分类号 H01L21/28
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