发明名称 |
Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film |
摘要 |
PCT No. PCT/JP94/02095 Sec. 371 Date Sep. 6, 1996 Sec. 102(e) Date Sep. 6, 1996 PCT Filed Dec. 14, 1994 PCT Pub. No. WO95/16797 PCT Pub. Date Jun. 22, 1995A Mo-W material for the formation of wirings is discloses which, as viewed integrally, comprises 20 to 95% of tungsten and the balance of molybdenum and inevitable impurities by atomic percentage. The Mo-W material for wirings is a product obtained by compounding and integrating a Mo material and a W material as by the powder metallurgy technique or the smelting technique or a product obtained by arranging these materials in amounts calculated to account for the percentage composition mentioned above. The Mo-W material containing W in a proportion in the range of from 20 to 95% manifests low resistance and, at the same time, excels in workability and tolerance for etchants. The wiring thin film which is formed of the Mo-W alloy of this percentage composition is used as address wirings and others for liquid crystal display devices. The Mo-W target for the formation of wirings is composed of 20 to 95% of tungsten and the balance of molybdenum and inevitable impurities by atomic percentage and allows the Mo-W wiring thin film to be produced with high repeatability.
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申请公布号 |
US5913100(A) |
申请公布日期 |
1999.06.15 |
申请号 |
US19960663251 |
申请日期 |
1996.09.06 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KOHSAKA, YASUO;FUKASAWA, YOSHIHARU;TSUJI, YOSHIKO;IKEDA, MITSUSHI;SATO, MICHIO;MAKI, TOSHIHIRO |
分类号 |
B22F1/00;C22C27/04;C23C14/34;G02F1/1362;H01L21/02;H01L21/768;H01L23/532;(IPC1-7):C22C27/04;B22F3/00 |
主分类号 |
B22F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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