发明名称 MOSFET having buried shield plate for reduced gate/drain capacitance
摘要 Gate to drain capacitance in a lateral DMOS and vertical DMOS field effect transistor is minimized by providing a conductive shield plate under the gate and between the gate and the drain of the transistor. In operation, the shield plate is preferably connected to a DC voltage potential and coupled to AC ground for RF power applications. The shield plate is readily fabricated in a conventional polysilicon gate process by adding one additional polysilicon deposition (or other suitable material), one additional mask, and one additional etch step. The shield plate can include a raised portion which provides lateral capacitive isolation between the gate and the drain. Alternatively, a shield contact can be provided above the shield plate and between the gate and drain to provide lateral isolation.
申请公布号 US5912490(A) 申请公布日期 1999.06.15
申请号 US19970905513 申请日期 1997.08.04
申请人 SPECTRIAN 发明人 HEBERT, FRANCOIS;NG, DANIEL
分类号 H01L23/552;H01L27/088;H01L29/06;H01L29/40;H01L29/78;(IPC1-7):H01L29/72 主分类号 H01L23/552
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