发明名称 COMBINED CMP AND WAFER CLEANING APPARATUS AND ASSOCIATED METHODS
摘要 An integral machine for polishing, cleaning, rinsing and drying workpieces such as semiconductor wafers. A load/unload station has a plurality of platforms for receiving cassettes of wafers to be processed. A dry end-effector of a robot retrieves wafers from the cassettes and transfers them to an index table. A transfer apparatus having wafer carrier elements picks up wafers from the index table, moves the wafers to a polishing table for polishing, and returns the wafers to the index table for further processing. A flipper moves the polished wafers to a cleaning station. The cleaning station includes scrub stations, a rinsing station and a spin dryer station, and a connective system of water tracks. A wet end-effector of the robot transfers rinsed wafers to the spin dryer station. The dry end-effector of the robot moves dried wafers from the spin dryer station back to the cassette of origination.
申请公布号 WO9913498(A3) 申请公布日期 1999.06.03
申请号 WO1998US18897 申请日期 1998.09.10
申请人 SPEEDFAM CORPORATION 发明人 GONZALES-MARTIN, JOSE, R.;KARLSRUD, CHRIS;ALLEN, ROBERT, F.;JORDAN, TOBY;HOWARD, CRAIG, M.;HAMER, ARTHUR;CUNNANE, JEFF;GOPALAN, PERIYA;THORNTON, WILLIAM;MACERNIE, JON, R.;CALDERON, FERNANDO
分类号 B24B37/04;B24B41/00;B65G49/07;H01L21/304;H01L21/306;H01L21/677 主分类号 B24B37/04
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