IC TESTING METHOD AND IC TESTING DEVICE USING THE SAME

摘要

An IC testing device which performs a function test and a DC test. A high-resistance resistor is connected to the output side of a DC testing device so that a function testing device can operate normally even when the DC testing device is connected to the function testing device. Thus a function test and a DC test are conducted in parallel by forcedly performing the DC test during the execution of the function test, and the switching time of a switch is not added to the testing time by executing time-consuming controls on the DC testing device such as the switching of the switch during the function test, thereby shortening the testing time.