| 摘要 |
<p>A method and apparatus are provided for detecting the presence of pit fragments as small as 2 mm2 in pitted peach halves. Pitted peach halves are agitated into a cup-up position, are conveyed to a position adjacent an inspection zone and are launched airborne into the inspection zone. Each peach half in the inspection zone is illuminated by a pair of quartz halogen lights and the diffusely reflected light is separated into first and second beams. The first and second beams are filtered to extract a first relatively wide wavelength band centered at 600 nm and a second relatively wide wavelength band centered at 750 nm. Preferably, each wavelength band is approximately 70 nm. Each of the wavelength bands enters a separate line scan camera for acquiring image signals from each wavelength band. The signals from both cameras are combined and enhanced to determine the presence or absence of fragments.</p> |
