发明名称 UNLANDED VIA STRUCTURE AND METHOD FOR MAKING SAME
摘要 A high density, low capacitance, interconnect structure for microelectronic devices has unlanded vias formed with organic polymer intralayer dielectric material (212) using substantially vertical sidewalls. A method of producing unlanded vias includes forming a planarized organic polymer intra-layer dielectric between conductors, forming an inorganic dielectric over the conductor and organic polymer layer, patterning a photoresist layer such that openings in the photoresist layer overlap portions of both the conductor and the intra-layer dielectric, etching the inorganic dielectric, and then concurrently stripping the photoresist, and anisotropically etching the organic polymer intra-layer dielectric. A second conductor (218) is typically deposited into the via opening so as to form an electrical connection to the first conductor (206). A silicon based insulator containing an organic polymer can alternatively be used to form the intra-layer dielectric.
申请公布号 WO9927571(A1) 申请公布日期 1999.06.03
申请号 WO1998US08617 申请日期 1998.04.29
申请人 INTEL CORPORATION 发明人 FANG, SYCHYI;CHIANG, CHIEN;FRASER, DAVID, B.
分类号 H01L21/768;H01L23/522;(IPC1-7):H01L21/302 主分类号 H01L21/768
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