发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a microcomputer capable of independently testing additional logic for user and an existing microcomputer part in the shipping test of the microcomputer with the built-in additional logic for the user. SOLUTION: Between the additional logic 5 for the user and the microcomputer 1, a connection dedicated logic part 4 directly connected to the internal bus 30 of the microcomputer 1 is provided. At the time of testing the additional logic 5 for the user, read/write are performed by using the bus/port switching terminal 3 of the microcomputer 1 and read/write signals. Also, the connection dedicated logic part 4 is provided with a register for a bus inspection, and at the time of testing the microcomputer, the bus is inspected by reading the output of the register for the inspection to the bus of the connection dedicated logic part 4.
申请公布号 JPH11149391(A) 申请公布日期 1999.06.02
申请号 JP19970331213 申请日期 1997.11.14
申请人 NEC CORP 发明人 MINE KAZUMASA
分类号 G01R31/28;G06F11/22;G06F11/267;G06F13/24;G06F15/78;H01L21/822;H01L27/04 主分类号 G01R31/28
代理机构 代理人
主权项
地址