发明名称 SPECIMEN STAND FOR SCANNING ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To carry out processing in the surface direction and shape evaluation and composition analysis in the cross-sectional direction in a short time by forming a plurality of angles (0 deg., +90 deg.,±45 deg.) in a setting and fixing face of a specimen stand, combining the face with an apparatus inclining mechanism, and using the specimen stand in common for the processing and observation at any angle. SOLUTION: Four screw holes 11-14 are formed in this specimen stand 8 to fix a specimen in a specimen holder, and a slide type specimen fixation plate 15 for pressing a specimen 4 and three fixing screw 16 are installed. In the case the specimen stand is used for cross-sectional surface processing of the specimen 4 in the surface direction by a converged ion beam processing and observing apparatus, the specimen 4 is fixed by using the screw hole 11. In order to observe and analyze the processed specimen 4 in the cross-sectional direction, the specimen is fixed in the specimen holder by the screw hole 13 and fixed in a scanning electron microscope. Observation and analysis from the direction at±45 deg. can be carried out by the use of the screw holes 12, 14, without the use of an inclining mechanism of the apparatus.
申请公布号 JPH11149896(A) 申请公布日期 1999.06.02
申请号 JP19970314819 申请日期 1997.11.17
申请人 HITACHI LTD;HITACHI INSTR ENG CO LTD 发明人 HIROTA HIDEKI;YAMAZAKI ITSUKI;KANEMURA TAKASHI
分类号 H01J37/20;(IPC1-7):H01J37/20 主分类号 H01J37/20
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